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Absolute and Relative Stability of an Optical Frequency Reference Based on Spectral Hole Burning in Eu~(3+):Y_2SiO_5

机译:Eu〜(3 +):Y_2SiO_5中基于光谱孔燃烧的光频率基准的绝对和相对稳定性

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摘要

We present and analyze four frequency measurements designed to characterize the performance of an optical frequency reference based on spectral hole burning in Eu~(3+):Y_2SiO_5. The first frequency comparison, between a single unperturbed spectral hole and a hydrogen maser, demonstrates a fractional frequency drift rate of 5 X 10~(-18) s~(-1). Optical frequency comparisons between a pattern of spectral holes, a Fabry-Perot cavity, and an Al~+ optical atomic clock show a short-term fractional frequency stability of 1 × 10~(-15)(τ)~(1/2) that averages down to 2.5~(+1.1)_(-0.5) × l0~(-16)at (τ) = 540 s (with linear frequency drift removed). Finally, spectral-hole patterns in two different Eu~(3+):Y_2SiO_5 crystals located in the same cryogenic vessel are compared, yielding a short-term stability of 7 × 10~(-16)τ~(-1/2) that averages down to 5.5~(+1.8)_(-0.9) × 10~(-17) at (τ) = 204 s (with quadratic frequency drift removed).
机译:我们提出并分析了四种频率测量,这些测量旨在表征基于Eu〜(3 +):Y_2SiO_5中光谱孔燃烧的光频率基准的性能。在单个无扰动的光谱孔和氢激射器之间的第一次频率比较表明,分数频率漂移率为5 X 10〜(-18)s〜(-1)。光谱孔,Fabry-Perot腔和Al〜+原子钟之间的光频率比较显示短期分数频率稳定性为1×10〜(-15)(τ)〜(1/2)在(τ)= 540 s时平均下降到2.5〜(+1.1)_(-0.5)×l0〜(-16)(去除了线性频率漂移)。最后,比较了位于同一低温容器中的两个不同Eu〜(3 +):Y_2SiO_5晶体中的光谱孔图,得出了7×10〜(-16)τ〜(-1/2)的短期稳定性。在(τ)= 204 s时平均下降至5.5〜(+1.8)_(-0.9)×10〜(-17)(去除了二次频率漂移)。

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