Comment on 'State-Dependent Electron Delocalization Dynamics at the Solute-Solvent Interface: Soft-X-Ray Absorption Spectroscopy and Ab initio Calculations'

摘要

A recent study by Bokarev et al. [1] utilized L edge x-ray absorption spectroscopy (XAS) in an attempt to detect electron delocalization dynamics at solute-solvent interfaces. By observing weaker spectral intensity at some parts of spectra detected using partial fluorescence yield (PFY) compared to the true XAS measured using both the transmission yield and inverse partial fluorescence yield techniques, the authors claim to "quantify unequivocally the state-dependent electron delocalization" with the transition metal 3d orbitals. While their study and conclusions are indeed interesting, here we will show that the observed spectral differences stem from the inherently different cross sections probed by the different techniques.