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首页> 外文期刊>Physica status solidi (a) Applications and materials science >Revival of Smooth MgO(100) Surface: Ar Ion-Beam Milling and Postvacuum Annealing in Oxygen Atmosphere
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Revival of Smooth MgO(100) Surface: Ar Ion-Beam Milling and Postvacuum Annealing in Oxygen Atmosphere

机译:平滑MgO(100)表面的复兴:氧气气氛中的AR离子束铣削和后撤退

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摘要

A recreation procedure for achieving the smooth and clean surface morphology ofthe degraded MgO(100) substrates is presented. The surfaces of the degradedMgO(100) substrates are treated with Ar ion-beammilling (IBM) and annealing inO_2 atmosphere. After each treatment, the changes in the MgO(100) substratesurface morphology are characterized using X-ray diffraction (XRD), a 3D opticalprofilometer, atomic force microscopy, and Fourier-transform infrared (FTIR)spectroscopy and compared with a fresh MgO substrate. It is shown that beforeany treatment, XRD and FTIR spectra show peaks corresponding to hydroxyl andcarbonate groups in the degraded samples, whereas after treatment, XRD andFTIR spectra are comparable with the fresh sample. Further, after treatment, thesurface roughness R_(av) value for two used/degraded samples reduces from 129and 186 nm to 3.96 and 7.91 nm, respectively, after combined Ar IBM andannealing treatment. It is shown that the surface quality of the treated MgO(100)substrate improves in comparison with as it was before any treatment and can bereused for the good quality thin-film deposition.
机译:实现平稳清洁表面形态的娱乐程序提出了降解的MgO(100)衬底。劣化的表面用Ar离子束射线(IBM)处理MgO(100)底物并退火O_2氛围。在每次治疗后,MgO(100)衬底的变化表面形态使用X射线衍射(XRD),3D光学特征profileometer,原子力显微镜和傅立叶变换红外(FTIR)光谱学和与新鲜的MgO衬底进行比较。它显示在之前任何治疗,XRD和FTIR光谱显示对应于羟基的峰值在降解样品中的碳酸盐基团,而治疗后,XRD和FTIR光谱与新鲜样品相当。此外,治疗后,表面粗糙度R_(AV)两个使用/劣化样品的值从129减少和186nm至3.96和7.91nm,分别组合后AR IBM和IBM和退火治疗。结果表明,处理的MgO(100)的表面质量与任何治疗之前的那样,基质改善,并且可以是重复使用优质的薄膜沉积。

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