Elliptical micropipes in SiC revealed by computer simulating phase contrast images

摘要

The elliptical micropipes in SiC arc studied using computer simulation of the phase contrast images. The experimental measurements of "white beam" images arc performed at third-generation synchrotron radiation source in Pohang, Korea. We reveal that the transmitted X-ray spectrum of a high brilliance with a pronounced maximum at 16 ke V enables to form partially coherent images even for transparent objects. The computer simulation allows one to automatically determine the diameters of elliptical cross-sections based on best matches between calculated and experimental intensity profiles. We show that the micropipes studied here have extended elliptical cross-sections, sometimes rotating around the micropipe axis.