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机译:大孔硅的微结构表征和内表面估计的阻抗测量
Department of Electronics and Telecommunication Engineering, Bengal Engineering and Science University, Shibpur,Botanic Garden, Howrah 711103, India;
School of Materials Science and Engineering, Bengal Engineering and Science University, Shibpur, Botanic Garden,Howrah 711103, India;
School of Materials Science and Engineering, Bengal Engineering and Science University, Shibpur, Botanic Garden,Howrah 711103, India;
impedance; microstructure; porous silicon;
机译:通过组合阻抗和表面温度测量来估算电池内部温度
机译:重力法发现大孔硅膜的内表面
机译:周期性微结构化硅表面的双向反射测量
机译:利用幅度测量表征高阻抗表面
机译:曲线天线应用中平坦和弯曲的圆对称高阻抗表面的分析,设计和测量
机译:基于微结构表征的三维复合微结构中的电化学阻抗的模拟及其应用
机译:使用具有阻抗测量功能的卡尔曼滤波器估算无传感器电池内部温度