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Nanoscale flux pinning sites in high-T_c superconductors

机译:高T_c超导体中的纳米级助焊剂固定位点

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Ideal flux pining centres in high-T_c superconductors should be of nanometre size as the coherence length, ξ, is so small. Therefore, the optimisation of high-T_c superconductor samples concerning high critical current densities and high flux pinning has to take place in the nanometre range. An important goal of the current research is to find specific preparation strategies to create such ideal flux pining sites already during the sample processing. By means of AFM and STM measurements at ambient conditions, we have investigated the topographies of various samples of YBa_2Cu_3O_x (YBCO), NdBa_2Cu_3O_x (NdBCO), SmBa_2Cu_3O_x (SmBCO), (Sm,Eu,Gd)Ba_2Cu_3O_x (SEG) and (Nd,Eu,Gd)Ba_2Cu_3O_x (NEG) high-T_c superconductors. We find that the two systems with the highest critical current densities (NEG, SEG) and hence, the strongest flux pinning, exhibit microstructures on the nanometre scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K).
机译:高T_c超导体中的理想磁通钉扎中心应具有纳米尺寸,因为相干长度ξ很小。因此,关于高临界电流密度和高通量钉扎的高T_c超导体样品的优化必须在纳米范围内进行。当前研究的一个重要目标是找到特定的制备策略,以在样品处理过程中就已经创建出理想的助焊剂固定位点。通过在环境条件下进行AFM和STM测量,我们研究了YBa_2Cu_3O_x(YBCO),NdBa_2Cu_3O_x(NdBCO),SmBa_2Cu_3O_x(SmBCO),(Sm,Eu,Gd)Ba_2Cu_3O_x(SEG)和(N Eu,Gd)Ba_2Cu_3O_x(NEG)高T_c超导体。我们发现,具有最高临界电流密度(NEG,SEG)和因此最强的通量钉扎的两个系统在纳米尺度上显示出与在YBCO系统中获得的显着不同的微观结构。在我们的地形测量中观察到的条状生长结构可能是关键电流密度得到显着改善的关键,特别是在高磁场和升高的工作温度(77 K)下。

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