首页> 外文期刊>Photovoltaics, IEEE Journal of >Electrical Repair of Incomplete Back Contact Insulation (P1) in Cu(In,Ga)Se src='/images/tex/21403.gif' alt='_2'> Photovoltaic Thin-Film Modules
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Electrical Repair of Incomplete Back Contact Insulation (P1) in Cu(In,Ga)Se src='/images/tex/21403.gif' alt='_2'> Photovoltaic Thin-Film Modules

机译:Cu(In,Ga)Se中不完全背接触绝缘(P1)的电修复 src =“ / images / tex / 21403.gif” alt =“ _ 2”> 光伏薄膜模块

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摘要

Incomplete P1 scribing lines between neighboring Mo back electrodes in Copper indium gallium selenide: Cu(In,Ga)Se (CIGS) thin-film modules have been repaired by removing the Mo remnants in the P1 laser line. The repair is achieved by melting and evaporating the Mo remnant with an electrical current. We develop a repair process that is robust to different lengths of the P1 line interruption, to arbitrary defect positions and defect numbers both within one scribing line and the complete module. Furthermore, the repair method provides a reliable feedback about a successful defect repair, whereby affected P1 scribing lines can be located and defects can be counted.
机译:硒化铜铟镓:Cu(In,Ga)Se(CIGS)薄膜模块中相邻Mo背电极之间的不完整P1刻划线已通过去除P1激光线中的Mo残留进行了修复。通过用电流熔化和蒸发残留的Mo来实现修复。我们开发了一种修复过程,该过程对于P1线中断的不同长度,一条划线和整个模块内的任意缺陷位置和缺陷编号均具有鲁棒性。此外,修复方法提供了有关成功进行缺陷修复的可靠反馈,从而可以定位受影响的P1划线,并可以对缺陷进行计数。

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