Electrical contact resistance and dynamic contact stiffness for a cluster of microcontacts: cross-property connection in the low-frequency range

摘要

An explicit cross-property connection for a rough interface between the electrical contact resistance and dynamic contact stiffness has been established in the low-frequency limit. The present analysis is based on the first-order asymptotic model of multiple dynamic contact between small flat-ended indenters on an elastic half-space, which is a dynamic analogue of the quasi-static Greenwood model. The obtained results can be used in developing a vibration method for measuring the interface contact stiffness in tribological systems, and in estimating the surface-roughness effect in oscillation indentation tests.