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首页> 外文期刊>Packaging Technology and Science >Helium transmission rate as a rapid and reliable method for assessing the water vapour transmission rate of transparent PET-SiO_x barrier foils
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Helium transmission rate as a rapid and reliable method for assessing the water vapour transmission rate of transparent PET-SiO_x barrier foils

机译:氦传输速率作为评估透明PET-SiO_x屏障箔的水蒸气传动速率的快速可靠方法

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摘要

A single quadrupole mass spectrometer coupled measuring setup was developed for the investigation of the helium transmission rate (HeTR) of SiOx-coated polyethylene terephthalate (PET) barrier films. The setup allows the pressure-less and time-resolved measurements of the helium permeation at transient and steady-state conditions. Whereas standard water vapour transmission rate (WVTR) experiments took extended test times (in the range of several days), HeTR measurements were finished after 1 h. For the material system investigated here, an excellent linear correlation of WVTR and HeTR was proven over two orders of magnitude (regarding WVTR). Experiments with application of different strain loads on the coated films revealed a significant increase of both, HeTR and WVTR. Scanning electron microscope (SEM) measurements evidenced multiple ruptures of the SiOx coating depending on the applied strain and initial thickness of the SiOx layer. Considering virgin barrier films and strain-ruptured barrier films, a good correlation of WVTR and HeTR was shown.
机译:开发了单个四极谱质谱仪耦合测量设置,用于研究SiOx涂层聚对苯二甲酸乙二醇酯(PET)阻隔膜的氦透射率(Hetr)。设置允许在瞬态和稳态条件下减去较低和时间分辨的氦渗透的测量。虽然标准水蒸气透射率(WVTR)实验进行了扩展的测试时间(在几天的范围内),但在1小时后完成Hetr测量。对于此处研究的材料系统,在两个数量级(关于WVTR)上被证明了WVTR和Hetr的优异线性相关性。在涂膜上施加不同应变载荷的实验显示,两者和WVTR的显着增加。扫描电子显微镜(SEM)测量值证明了SiOx涂层的多次破裂,这取决于SiOx层的施加应变和初始厚度。考虑到原始阻挡膜和应变破裂的阻隔膜,显示了WVTR和HETT的良好相关性。

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