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Use of gas cluster ion source depth profiling to study the oxidation of fullerene thin films by XPS

机译:使用气体团簇离子源深度分析研究XPS对富勒烯薄膜的氧化

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摘要

The analysis of organic materials such as phenyl-C61-butyric acid methyl ester (PC_(61)BM) by depth profiling is typically fraught with difficulty due to the fragile nature of the sample. In this work we utilise a gas cluster ion source for the controlled depth profiling of organic materials that would historically have been too fragile to analyse and obtain quantitative compositional data through the whole thickness of the film. In particular we examine the oxygen diffusion and photo-oxidation kinetics of one of the most commonly used electron acceptor materials for many organic optoelectronic applications, namely PC_(61)BM, in both neat films and in blends with polystyrene. Exposure to AM1.5G light and air under ambient conditions, results in a higher level of surface oxidation of blended PC_(61)BM: polystyrene than is observed for either pure control film. Gas cluster ion source depth profiling further confirms that this oxidation is strongest at the extreme surface, but that over time elevated oxygen levels associated with oxidised organic species are observed to penetrate through the whole blended film. The results presented herein provide further insights on the environmental stability of fullerene based organic optoelectronic devices.
机译:由于样品的易碎性质,通过深度轮廓分析有机材料,例如苯基-C61-丁酸甲酯(PC_(61)BM)通常非常困难。在这项工作中,我们利用气体团簇离子源对有机材料进行可控的深度剖析,而这种材料在历史上一直太脆弱,无法分析和获得整个膜层厚度的定量组成数据。特别是,我们检查了纯有机膜和与聚苯乙烯共混物中许多有机光电应用中最常用的电子受体材料之一PC_(61)BM的氧扩散和光氧化动力学。在环境条件下暴露于AM1.5G光和空气中,导致PC_(61)BM:聚苯乙烯共混物的表面氧化水平高于任一纯控制膜所观察到的水平。气体团簇离子源深度剖析进一步证实了这种氧化在极端表面最强,但是随着时间的流逝,观察到与氧化的有机物质相关的升高的氧气水平会穿透整个混合膜。本文提供的结果提供了有关基于富勒烯的有机光电器件的环境稳定性的进一步见解。

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  • 来源
    《Organic Electronics》 |2017年第10期|85-93|共9页
  • 作者单位

    SPECIFIC, Swansea University, Bay Campus, Swansea, Wales SA1 8EN, UK;

    SPECIFIC, Swansea University, Bay Campus, Swansea, Wales SA1 8EN, UK;

    SPECIFIC, Swansea University, Bay Campus, Swansea, Wales SA1 8EN, UK;

    SPECIFIC, Swansea University, Bay Campus, Swansea, Wales SA1 8EN, UK;

    SPECIFIC, Swansea University, Bay Campus, Swansea, Wales SA1 8EN, UK,Centre for Plastic Electronics, Department of Chemistry, Imperial College London, London, SW7 2AZ, UK;

    SPECIFIC, Swansea University, Bay Campus, Swansea, Wales SA1 8EN, UK;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    OPV; PCBM; Degradation; XPS; GCIS;

    机译:OPV;PCBM;降解;XPS;GCIS;

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