机译:通过“快速俘获与缓慢解俘获”模型在单晶OFET中的本征载流子迁移率
School of Advanced Materials, Peking University Shenzhen Graduate School;
School of Advanced Materials, Peking University Shenzhen Graduate School;
School of Advanced Materials, Peking University Shenzhen Graduate School;
School of Advanced Materials, Peking University Shenzhen Graduate School;
School of Advanced Materials, Peking University Shenzhen Graduate School;
Institute of Advanced Materials, Nanjing Tech University,Department of Physics, International Islamic University;
School of Advanced Materials, Peking University Shenzhen Graduate School;
Research Center for Integrated Quantum Electronics, Hokkaido University;
School of Advanced Materials, Peking University Shenzhen Graduate School,Institute of Advanced Materials, Nanjing Tech University;
School of Advanced Materials, Peking University Shenzhen Graduate School;
Single-crystal organic field-effect transistor (OFET); Intrinsic charge carrier mobility; Gate stress; Hole traps; Threshold voltage shift; Mobility anisotropy;
机译:受PBTI应力影响的高k电介质中快速和慢速电荷陷阱/去陷阱过程的实验证据
机译:讨论光催化分析中的电荷载体转移,包括热力学和动力学方面,理论考虑,电荷载流子的内在陷阱,颗粒间/间隔电荷转移和建模(Vol 31,PG CH 4,2020)
机译:HF介电基场效应晶体管的负偏置温度不稳定性中的慢陷阱充电和去陷阱
机译:高k nMOSFET中的快速和慢速电荷陷阱/去陷阱工艺
机译:载流子迁移率,电荷陷阱对重掺杂有机发光二极管和基于Europlum(lll)的红色OLED的效率产生影响。
机译:可逆电荷载流子陷阱减慢了福斯特CdSe / CdS量子点固体中的能量转移
机译:官能化菲的聚集行为和高电荷载体9,10D咪唑
机译:位错和凹凸处的正电子诱捕和脱离模型