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首页> 外文期刊>Optics and Lasers in Engineering >Phase extraction using multi-directional moire fringes for multi-lateral shearing interferometry
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Phase extraction using multi-directional moire fringes for multi-lateral shearing interferometry

机译:使用多方向莫尔条纹进行多边剪切干涉法的相提取

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摘要

The multi-lateral shearing interferometers (multi-LSIs) are featured in the improved accuracy and noise resistance of wavefront reconstruction using phase differences in multiple directions. Nowadays the multidirectional phase differences are usually extracted from multi-LSIs' interferogram using the fast Fourier transform (FFT) method, whose accuracy is limited by spectral leakage effect. To improve the measurement accuracy of multi-LSIs, a phase extraction method developed from moire technique is proposed in this paper. Using virtual gratings with properly large carrier frequencies, the desired phase information in each of the multiple directions can be modulated into low-frequency domain of the corresponding moire pattern with larger separations between unnecessary side lobes. In this way, low-pass filters with higher cut-off frequencies can be applied in moire technique to reduce the inaccuracy induced by spectral leakage effect. Meanwhile, phase shifting method can be applied to extract phase information from a single fringe pattern with better noise resistance by easily introducing phase shifts in computer generated virtual gratings. Simulation results show that the proposed method has higher accuracy and better anti-noise performance than the FFT method when spectral leakage effect exists. To demonstrate accuracy of the proposed method, a null test experiment of the quadriwave LSI has been conducted and experimental results show that measurement accuracy of the quadriwave LSI can be significantly improved by substituting the FFT method with the proposed method in phase extraction process.
机译:多边剪切干涉仪(multi-LSIs)的特点是使用多个方向上的相位差提高了波前重建的精度和抗噪性。如今,通常使用快速傅立叶变换(FFT)方法从多LSI干涉图中提取多方向相位差,其准确性受到频谱泄漏效应的限制。为了提高多LSI的测量精度,提出了一种基于莫尔条纹技术的相位提取方法。使用具有适当大的载波频率的虚拟光栅,可以将多个方向的每个方向上的所需相位信息调制到相应的莫尔条纹图案的低频域中,并在不必要的旁瓣之间留出较大的间隔。这样,具有较高截止频率的低通滤波器可用于莫尔条纹技术中,以减少由频谱泄漏效应引起的不准确性。同时,可以通过在计算机生成的虚拟光栅中轻松引入相移,采用相移方法从具有更好抗噪性的单个条纹图案中提取相位信息。仿真结果表明,在存在频谱泄漏效应的情况下,该方法比FFT方法具有更高的精度和更好的抗噪性能。为了证明该方法的准确性,已经进行了四波大规模集成电路的空测试实验,实验结果表明,通过在相位提取过程中用该方法代替FFT方法,可以显着提高四波大规模集成电路的测量精度。

著录项

  • 来源
    《Optics and Lasers in Engineering》 |2017年第3期|81-90|共10页
  • 作者单位

    Beijing Inst Technol, Sch Optoelect, Minist Educ China, Key Lab Photoelectron Imaging Tech & Syst, Beijing 100081, Peoples R China;

    Beijing Inst Technol, Sch Optoelect, Minist Educ China, Key Lab Photoelectron Imaging Tech & Syst, Beijing 100081, Peoples R China;

    Beijing Inst Technol, Sch Optoelect, Minist Educ China, Key Lab Photoelectron Imaging Tech & Syst, Beijing 100081, Peoples R China;

    Beijing Inst Technol, Sch Optoelect, Minist Educ China, Key Lab Photoelectron Imaging Tech & Syst, Beijing 100081, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Lateral shearing interferometry; Fringe analysis; Phase retrieval; Fast Fourier transform; Moire technique;

    机译:横向剪切干涉法;边缘分析;相检索;快速傅里叶变换;莫尔技术;

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