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Investigations of structural defects, crystalline perfection, metallic impurity concentration and optical quality of flat-top KDP crystal

机译:平顶KDP晶体的结构缺陷,晶体完善,金属杂质浓度和光学质量的研究

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摘要

KDP crystal grown using flat-top technique has been characterized using X-ray and optical techniques with the aim of correlating the defects structure and impurity concentration in the crystal with its optical properties. Crystallographic defects were investigated using X-ray topography revealing linear and arc like chains of dislocations and to conclude that defects do not originate from the flat-top part of the crystal. Etching was performed to quantify dislocation defects density. The crystalline perfection of the crystal was found to be high as the FWHM of the rocking curves measured at several locations was consistently low 6-9 arc s. The concentration of Fe metallic impurity quantified using X-ray fluorescence technique was approximately 5 times lower in the flat-top part which falls in pyramidal growth sector as compared to the region near to the seed which lies in prismatic sector. The spectrophotometric characterization for plates cut normal to different crystallographic directions in the flat-top potassium dihydrogen phosphate (FT-KDP) crystal was performed to understand the influence of metallic impurity distribution and growth sectors on the optical transmittance. The transmittance of the FT-KDP crystal at 1064 nm and its higher harmonics (2nd, 3rd, 4th and 5th) was determined from the measured spectra and the lower transmission in the UV region was attributed to increased absorption by Fe metallic impurity at these wavelengths. The results are in agreement with the results obtained using X-ray fluorescence and X-ray topography. Birefringence and Mach Zehnder interferometry show that except for the region near to the seed crystal the optical homogeneity of the entire crystal was good. The laser-induced damage threshold (LDT) values are in the range 2.4-3.9 GW/cm(2). The LDT of the plate taken from the flat-top region is higher than that from the bottom of the crystal, indicating that the flat-top technique has good optical quality and is comparable to those reported using rapid growth technique. The results indicate that the structural defects, crystalline quality and impurity concentration have a correlation with the optical properties of the FT-KDP crystal. (C) 2015 Elsevier B.V. All rights reserved.
机译:利用X射线和光学技术表征了使用平顶技术生长的KDP晶体,其目的是使晶体中的缺陷结构和杂质浓度与其光学性质相关。使用X射线形貌研究了晶体学缺陷,揭示了线性和弧形的位错链,并得出结论,缺陷并非源自晶体的平顶部分。进行蚀刻以量化位错缺陷密度。由于在几个位置测得的摇摆曲线的FWHM始终低6-9 arc s,因此发现晶体的晶体完美度很高。用X射线荧光技术定量的Fe金属杂质的浓度,在金字塔形生长区的平顶部分,比靠近棱柱形的种子区域低约5倍。对在平顶磷酸二氢钾(FT-KDP)晶体中垂直于不同晶体学方向切割的板进行分光光度表征,以了解金属杂质分布和生长扇区对光透射率的影响。 FT-KDP晶体在1064 nm处的透射率及其高次谐波(第2,第3,第4和第5次)由测得的光谱确定,在UV区域中较低的透射率归因于这些波长下Fe金属杂质的吸收增加。结果与使用X射线荧光和X射线形貌获得的结果一致。双折射和马赫·策恩德(Mach Zehnder)干涉法表明,除了靠近晶种的区域外,整个晶体的光学均匀性都很好。激光引起的损伤阈值(LDT)值在2.4-3.9 GW / cm(2)的范围内。从平顶区域获取的平板的LDT高于从晶体底部获取的平板的LDT,这表明平顶技术具有良好的光学质量,可与使用快速生长技术报道的技术相媲美。结果表明,结构缺陷,晶体质量和杂质浓度与FT-KDP晶体的光学性质相关。 (C)2015 Elsevier B.V.保留所有权利。

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