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Effects of structural defects on laser-induced damage of 355-nm high-reflective coatings sputtered on etched substrates

机译:结构缺陷对刻蚀衬底上溅射的355 nm高反射​​涂层激光诱导损伤的影响

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摘要

Laser-induced damage of ultraviolet (UV) coatings poses a great challenge and restricts its application in space. Coatings prepared by ion beam sputtering are dense and possess high laser-induced damage threshold (LIDT), which are absence of structural nodule defects. Subsurface damage defects easily exposed by etching are inevitable under substrate grinding and polishing processes, which are usually ignored in electron-beam evaporation coatings. In our experiments, we find that LIDT of 355-nm high-reflection (HR) coatings sputtered on etched substrates declines dramatically, meanwhile defect density increases. Pits are found on the surface of the substrates and the coatings, and the pits that induce laser damage are very small (submicron-scale). Laser damage morphologies reveal that damage sites are prone to occur around the pits caused by acid etching. Finite element analysis shows consistent results, enhancement of electric field and rise of temperature are obvious, and the most significant part is around the pits, which is prone to induce damage. To conclude, small structural defects are sensitive to laser-induced damage of HR coatings prepared by dual ion beam sputtering (DIBS). This work contributes to finding new ways of improving the LIDT of sputtering coatings.
机译:激光导致的紫外线(UV)涂层损坏带来了巨大挑战,并限制了其在太空中的应用。通过离子束溅射制备的涂层致密且具有高的激光诱导损伤阈值(LIDT),而没有结构结节缺陷。在基材的研磨和抛光过程中不可避免地会因蚀刻而暴露出的次表面损伤缺陷是不可避免的,而在电子束蒸发涂层中通常会忽略这些缺陷。在我们的实验中,我们发现溅射在蚀刻的基板上的355 nm高反射​​(HR)涂层的LIDT急剧下降,同时缺陷密度增加。在基材和涂层的表面上发现了凹坑,引起激光损伤的凹坑非常小(亚微米级)。激光损伤形态表明,酸蚀引起的蚀坑周围容易出现损伤部位。有限元分析显示出一致的结果,电场的增强和温度的升高是明显的,并且最重要的部分是凹坑周围,这易于引起损坏。总之,小的结构缺陷对通过双离子束溅射(DIBS)制备的HR涂层的激光诱导损伤很敏感。这项工作有助于寻找新方法来改善溅射涂层的LIDT。

著录项

  • 来源
    《Optical Materials》 |2019年第3期|173-177|共5页
  • 作者单位

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China|Univ Chinese Acad Sci, Beijing 100049, Peoples R China;

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China|Univ Chinese Acad Sci, Beijing 100049, Peoples R China;

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;

    Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Thin Film Opt, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    355 nm; Laser damage; HR coatings; Structural defects; Dual ion beam sputtering;

    机译:355 nm;激光损伤;HR涂层;结构缺陷;双离子束溅射;

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