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Monte Carlo simulation of three-dimensional measurements of translucent objects

机译:透明物体的三维测量的蒙特卡洛模拟

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摘要

In a previous article, we described the deviation between the real and the measured object surface that occurs when a translucent object is scanned by an active triangulation system. This error depends on the angle between the measurement direction and the object's surface normal, the surface reflection behavior, which can be described by a bidirectional reflectance distribution function, and the light penetration behavior. In general, the error is small if the surface is perpendicular to the measurement direction; it increases if the surface is tilted and decreases again for flat angles. This error curve is additionally affected by the surface roughness. The angle dependence is more distinct for smooth surfaces. In order to predict and compensate for the error, it is necessary to understand the error-forming process. Therefore, Monte Carlo simulations of several measurements were performed. As the computational cost is very high for three-dimensional simulations, most of the simulations were performed in two-dimensional space. We present the results of these simulations and discuss how the measurement error depends on the surface roughness, the measurement direction, and the scattering behavior of the material.
机译:在上一篇文章中,我们描述了当用主动三角测量系统扫描半透明物体时出现的真实物体表面和被测物体表面之间的偏差。该误差取决于测量方向和物体表面法线之间的角度,表面反射行为(可以通过双向反射率分布函数描述)以及光穿透行为。通常,如果表面垂直于测量方向,则误差很小;如果表面倾斜,则增加;对于平面角度,则再次减小。该误差曲线还受到表面粗糙度的影响。对于光滑表面,角度依赖性更为明显。为了预测和补偿错误,有必要了解错误形成过程。因此,进行了几次测量的蒙特卡洛模拟。由于三维仿真的计算成本很高,因此大多数仿真都是在二维空间中进行的。我们介绍了这些模拟的结果,并讨论了测量误差如何取决于表面粗糙度,测量方向和材料的散射行为。

著录项

  • 来源
    《Optical engineering》 |2015年第8期|084111.1-084111.9|共9页
  • 作者单位

    Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Straße 7, Jena 07745, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Straße 7, Jena 07745, Germany;

    Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Straße 7, Jena 07745, Germany;

    Friedrich Schiller University, Jena Institute of Applied Optics, Fröbelstieg 1, Jena 07743, Germany;

    Technical University llmenau, Group for Quality Assurance and Industrial Image Processing, Gustav-Kirchhoff-Platz 2, llmenau 98693, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    three-dimensional; translucent; active triangulation; simulation; monte carlo;

    机译:三维;半透明;主动三角剖分;模拟;蒙特卡洛;

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