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首页> 外文期刊>Optical engineering >Group and phase birefringence dispersion of pure and doped lithium niobate crystals obtained by analysis of interference pattern observed behind a plane polariscope
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Group and phase birefringence dispersion of pure and doped lithium niobate crystals obtained by analysis of interference pattern observed behind a plane polariscope

机译:通过分析平面偏振镜后观察到的干涉图获得纯净和掺杂铌酸锂晶体的基团和相双折射色散

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摘要

A sample of lithium niobate crystal with known thickness is set on a vertical rotary stage, placed in between two crossed plane polarizers and illuminated by a collimated beam of white light. The sample is rotated to an appropriate position, and interference fringes observed behind an analyzer are recorded by a fiber-optic spectrometer. The recorded channeled spectrum is then analyzed, and from measured positions of interference minima (dark fringes) and known crystal's thickness, the group birefringence of the crystal sample is obtained as a function of wavelength. The fringe order versus position of the fringe within the spectrum is fitted by appropriate dispersion function, and as the result phase birefringence as a function of wavelength is found. The measurement is performed for a sample declared as undoped, a sample doped with 0.025 wt. % of Fe, and a sample doped with 0.025 wt. % of Fe and 0.075 wt. % of Mn in the wavelength ranges (470 to 780) nm and (900 to 1700) nm. A good agreement between group birefringence dispersion obtained from positions of interference minima and known sample's thickness and that calculated from phase birefringence dispersion given by Sellmeier dispersion model (used for undoped sample) and Cauchy model (used for doped samples) is found.
机译:将已知厚度的铌酸锂晶体样品放在垂直旋转台上,置于两个交叉的平面偏振器之间,并用准直的白光照射。将样品旋转到合适的位置,并通过光纤光谱仪记录分析仪后面观察到的干涉条纹。然后分析记录的通道光谱,并从测得的极小值干涉(暗条纹)和已知晶体的厚度,得出晶体样品的基团双折射与波长的关系。通过适当的色散函数拟合条纹在光谱中的条纹顺序与位置的关系,结果发现了相位双折射与波长的关系。对宣布为未掺杂的样品(掺杂有0.025 wt。%的样品)进行测量。 %的Fe,和掺杂0.025重量%的样品。铁的百分比和0.075重量%在(470至780)nm和(900至1700)nm波长范围内Mn的%。发现从最小干涉位置和已知样品厚度获得的组双折射色散与由Sellmeier色散模型(用于未掺杂样品)和柯西模型(用于掺杂样品)给出的相位双折射色散计算得出的良好一致性。

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