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Statistical photocalibration of photodetectors for radiometry without calibrated light sources

机译:无需校准光源的用于辐射测量的光探测器的统计光校准

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摘要

Calibration of CCD arrays for identifying bad pixels and achieving nonuniformity correction is commonly accomplished using dark frames. This kind of calibration technique does not achieve radiometric calibration of the array since only the relative response of the detectors is computed. For this, a second calibration is sometimes utilized by looking at sources with known radiances. This process can be used to calibrate photo-detectors as long as a calibration source is available and is well-characterized. A previous attempt at creating a procedure for calibrating a photodetector using the underlying Poisson nature of the photodetection required calculations of the skewness of the photodetector measurements. Reliance on the third moment of measurement meant that thousands of samples would be required in some cases to compute that moment. A photo-calibration procedure is defined that requires only first and second moments of the measurements. The technique is applied to image data containing a known light source so that the accuracy of the technique can be surmised. It is shown that the algorithm can achieve accuracy of nearly 2.7% of the predicted number Of photons using Only 100 frames Of image data.
机译:通常使用暗帧来完成用于识别不良像素并实现不均匀校正的CCD阵列的校准。由于仅计算探测器的相对响应,因此这种校准技术无法实现阵列的辐射校准。为此,有时通过查看具有已知辐射的光源来进行第二次校准。只要校准源可用且特性良好,此过程即可用于校准光电探测器。先前使用光检测的潜在泊松性质来创建用于校准光检测器的程序的尝试需要计算光检测器测量的偏斜度。依赖于第三测量时刻,意味着在某些情况下需要数千个样本来计算该时刻。定义了仅需要第一刻和第二刻测量的光校准程序。将该技术应用于包含已知光源的图像数据,以便可以推测该技术的准确性。结果表明,仅使用100帧图像数据,该算法就可以达到预测光子数的近2.7%的精度。

著录项

  • 来源
    《Optical engineering》 |2018年第1期|014107.1-014107.5|共5页
  • 作者单位

    Wright-Patterson Air Force Base, Air Force Institute of Technology, Department of Electrical and Computer Engineering, Dayton, Ohio, United States;

    Wright-Patterson Air Force Base, Air Force Institute of Technology, Department of Electrical and Computer Engineering, Dayton, Ohio, United States;

    Wright-Patterson Air Force Base, Air Force Institute of Technology, Department of Electrical and Computer Engineering, Dayton, Ohio, United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    calibration; detection; statistical optics;

    机译:校准;检测;统计光学;

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