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首页> 外文期刊>Optical engineering >Accurate experimental detection method for characterizing superoscillatory lenses made from multiannular metasurfaces
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Accurate experimental detection method for characterizing superoscillatory lenses made from multiannular metasurfaces

机译:精确的实验检测方法,用于表征由多环形超表面制成的超振动透镜

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摘要

To verify the superoscillatory optical diffraction focusing characteristics of multiannular metasurfaces (MAMs), we propose an experimental detection method. It consists of two parts, the reflection positioning optical system and transmission detection imaging system. The best focal plane of the superoscillatory optical diffraction focus for the MAM can be precisely positioned through the reflection positioning optical system, which is the core part of the experimental detection method and is based on the structured illumination optical sectioning principle. A typical MAM is designed using vectorial angular spectrum (VAS) theory and a genetic algorithm. It was fabricated by focused ion-beam milling. The three-dimensional finite-difference time-domain method is used to verify the intensity distribution of the focus predicted by the VAS theory. For the designed 14-μm-diam-eter MAM at a wavelength of 640 nm, the simulation result broadly agrees with the experimental result obtained from the transmission microscopic imaging system. The proposed detection method can be used in fields such as optical diffraction focusing and subwavelength resolution imaging.
机译:为了验证多环形超表面(MAM)的超振荡光学衍射聚焦特性,我们提出了一种实验检测方法。它由反射定位光学系统和透射检测成像系统两部分组成。可以通过反射定位光学系统精确定位MAM的超振荡光学衍射焦点的最佳焦平面,这是实验检测方法的核心部分,并且基于结构化照明光学切片原理。使用矢量角谱(VAS)理论和遗传算法设计典型的MAM。它是通过聚焦离子束铣削制造的。三维时域有限差分法用于验证VAS理论预测的焦点强度分布。对于设计的波长为640 nm的14μm直径MAM,仿真结果与透射显微成像系统获得的实验结果大致吻合。提出的检测方法可用于光学衍射聚焦和亚波长分辨率成像等领域。

著录项

  • 来源
    《Optical engineering》 |2018年第1期|017110.1-017110.5|共5页
  • 作者单位

    Xi'an Jiaotong University, State Key Laboratory for Manufacturing System Engineering, Xi'an, China,Zhengzhou University of Light Industry, Institute of Mechanical and Electrical Engineering, Zhengzhou, China;

    Xi'an Jiaotong University, State Key Laboratory for Manufacturing System Engineering, Xi'an, China;

    Xi'an Jiaotong University, State Key Laboratory for Manufacturing System Engineering, Xi'an, China;

    Xi'an Jiaotong University, State Key Laboratory for Manufacturing System Engineering, Xi'an, China;

    Xi'an Jiaotong University, State Key Laboratory for Manufacturing System Engineering, Xi'an, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    diffraction; microstructure; superresolution; polarization;

    机译:衍射;微观结构超分辨率偏振;

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