首页> 外文期刊>Optical and quantum electronics >Simulation of laser beam induced current for HgCdTe photodiodes with leakage current
【24h】

Simulation of laser beam induced current for HgCdTe photodiodes with leakage current

机译:具有泄漏电流的HgCdTe光电二极管激光束感应电流的仿真

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

We report on 2D numerical simulations of laser beam induced current (LBIC) for HgCdTe photovoltaic detector. The effect of junction leakage current on LBIC signal is investigated, and different leakage paths caused by different reasons in HgCdTe photodiode arrays are taken into account in the simulation. The simulation results are in good agreement with the experiment data. Simulation results suggest that LBIC can be used to determine the existence of junction leakage current and investigate the origin of junction leakage current.
机译:我们报告了HgCdTe光电探测器的激光束感应电流(LBIC)的二维数值模拟。研究了结漏电流对LBIC信号的影响,并在仿真中考虑了由于不同原因在HgCdTe光电二极管阵列中引起的不同漏电路径。仿真结果与实验数据吻合良好。仿真结果表明,LBIC可用于确定结漏电流的存在并研究结漏电流的起源。

著录项

  • 来源
    《Optical and quantum electronics》 |2009年第13期|P.805-810|共6页
  • 作者单位

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

    National Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    numerical simulation; HgCdTe infrared photodiode; laser beam induced current (LBIC); leakage current;

    机译:数值模拟HgCdTe红外光电二极管;激光束感应电流(LBIC);漏电流;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号