Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir-Blodgett techniques

摘要

A silica monolayer has been introduced between tow artificial silica opals using Langmuir Blodgett and inverse Schaefer transfer techniques. The structure and optical properties of the sandwich structure have been characterized by atomic force microscopy, scanning electron microscopy and specular reflection and transmission spectra. The quality of the defect mode inside the stopband made by inverse Schaefer technique is as good as the one obtained by the most commonly used Langmuir-Blodgett technique. Finite difference time domain simulations have been performed and show very good agreement with experimental result.