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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Preliminary measurements on the new TOF system installed at the AMS beamline of INFN-LABEC
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Preliminary measurements on the new TOF system installed at the AMS beamline of INFN-LABEC

机译:在INFN-LABEC的AMS光束线上安装的新TOF系统的初步测量

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A high resolution time of flight (TOF) system has been developed at LABEC, the 3 MV Tandem accelerator laboratory in Florence, in order to improve the sensitivity of AMS measurements on carbon samples with ultra-low concentration and also to measure other isotopes, such as ~(129)I. The system can be employed to detect and identify residual interfering particles originated from the break-up of molecular isobars. The set-up has been specifically designed for low energy heavy ions: it consists of two identical time pick-off stations, each made up of a thin conductive foil and a Micro-Channel Plate (MCP) multiplier. The beam-line is also equipped with a silicon detector, installed downstream the stop TOF station. In this paper the design of the new system and the implemented readout electronics are presented. The tests performed on the single time pick-off station are reported: they show that the maximum contribution to the timing resolution given by both the intrinsic MCP resolution and the electronics is ≤500 ps (FWHM). For these tests, single particle pulsed beams of 2-5 MeV protons and 10 MeV ~(12)C~(3+) ions, to simulate typical AMS conditions, were used. The preliminary TOF and TOF-E (TOF-energy) measurements performed with carbon beams after the installation of the new system on the AMS beam line are also discussed. These measurements were performed using the foil-MCP as the start stage and a silicon detector as the stop stage. The spectra acquired with carbon ions suggest the presence of a small residual background from neighboring masses reaching the end of the beamline with the same energy as the rare isotope.
机译:LABEC(佛罗伦萨的3 MV串联加速器实验室)已经开发了高分辨率的飞行时间(TOF)系统,目的是提高AMS测量对超低浓度碳样品的灵敏度,并测量其他同位素,例如作为〜(129)I。该系统可用于检测和识别源自分子等压线破裂的残留干扰颗粒。该装置是专门为低能量重离子设计的:它由两个相同的时间提取站组成,每个提取站均由薄导电箔和微通道板(MCP)倍增器组成。束线还配备了一个硅探测器,安装在停止TOF站的下游。本文介绍了新系统的设计和已实现的读出电子设备。报告了在单个时间提取站上进行的测试:它们表明,固有MCP分辨率和电子器件对时序分辨率的最大贡献为≤500 ps(FWHM)。对于这些测试,使用了2-5 MeV质子和10 MeV〜(12)C〜(3+)离子的单粒子脉冲束,以模拟典型的AMS条件。还讨论了在AMS束线上安装新系统后,用碳束进行的初步TOF和TOF-E(TOF能量)测量。使用箔MCP作为开始阶段,并使用硅检测器作为停止阶段来执行这些测量。用碳离子获取的光谱表明,来自邻近质量的少量残留背景以与稀有同位素相同的能量到达了束线的末端。

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