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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Implementing displacement damage calculations for electrons and gamma rays in the Particle and Heavy-Ion Transport code System
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Implementing displacement damage calculations for electrons and gamma rays in the Particle and Heavy-Ion Transport code System

机译:在粒子和重离子传输代码系统中实现电子和伽马射线的位移损伤计算

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In this study, the Monte Carlo displacement damage calculation method in the Particle and Heavy-Ion Transport code System (PHITS) was improved to calculate displacements per atom (DPA) values due to irradiation by electrons (or positrons) and gamma rays. For the damage due to electrons and gamma rays, PHITS simulates electromagnetic cascades using the Electron Gamma Shower version 5 (EGS5) algorithm and calculates DPA values using the recoil energies and the McKinley–Feshbach cross section. A comparison of DPA values calculated by PHITS and the Monte Carlo assisted Classical Method (MCCM) reveals that they were in good agreement for gamma-ray irradiations of silicon and iron at energies that were less than 10 MeV. Above 10 MeV, PHITS can calculate DPA values not only for electrons but also for charged particles produced by photonuclear reactions. In DPA depth distributions under electron and gamma-ray irradiations, build-up effects can be observed near the target’s surface. For irradiation of 90-cm-thick carbon by protons with energies of more than 30 GeV, the ratio of the secondary electron DPA values to the total DPA values is more than 10% and increases with an increase in incident energy. In summary, PHITS can calculate DPA values for all particles and materials over a wide energy range between 1 keV and 1 TeV for electrons, gamma rays, and charged particles and between 10−5 eV and 1 TeV for neutrons.
机译:在这项研究中,改进了粒子和重离子迁移代码系统(PHITS)中的蒙特卡洛位移破坏计算方法,以计算由于电子(或正电子)和伽马射线辐照而产生的每原子位移(DPA)值。对于由于电子和伽马射线造成的损坏,PHITS使用电子伽玛淋浴版本5(EGS5)算法来模拟电磁级联,并使用反冲能量和麦金莱–菲什巴赫横截面来计算DPA值。通过PHITS和蒙特卡洛辅助经典方法(MCCM)计算得出的DPA值的比较显示,它们与能量小于10 MeV的硅和铁的伽马射线辐照非常吻合。高于10 MeV,PHITS不仅可以计算电子的DPA值,还可以计算光核反应产生的带电粒子的DPA值。在电子和伽马射线辐照下的DPA深度分布中,可以在目标表面附近观察到堆积效应。对于能量大于30 withGeV的质子辐照90-cm厚的碳,二次电子DPA值与总DPA值之比大于10%,并且随着入射能量的增加而增加。总而言之,PHITS可以计算在电子,伽马射线和带电粒子的1VkeV和1 TeV之间以及中子的10-5 eV和1 TeV之间的宽能量范围内所有粒子和材料的DPA值。

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