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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Measurement of reduced radii, depths, and optical densities of pits using computer analysis of micrographs of CR-39 plates etched after irradiation with ~(12)C ion beam
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Measurement of reduced radii, depths, and optical densities of pits using computer analysis of micrographs of CR-39 plates etched after irradiation with ~(12)C ion beam

机译:使用〜(12)C离子束照射后使用CR-39板的显微照片计算坑的减小的半径,深度和光学密度。

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This work is a further development of our method, published in 2018, for computer analysis of micrographs taken from a plastic detector CR-39, etched after irradiation with a beam of ~(12)C ions of energy 216 MeV/amu in the radiobiological research chamber of the ITEP-TWAC accelerator-storage complex. The aim of this work is to study geometric and optical parameters of pits in the etched plastic. This study is based on a new concept of reduced radii, which are the radii of the cross-section of inclined conical micro- and nano-pits at the points of intersection of their longitudinal axes and the etching surface of the detector; formulas for their calculations are derived. One CR-39 plate was irradiated in a radiobiological chamber filled with air, and eight plates were exposed at different depths of the chamber filled with water (phantom). 275,070 images of etched pores were found and analyzed in the plates. Differential frequency distributions of the reduced radii and depths of the pits and their average values on the etched surfaces of the plates are obtained. Formulas for nanodensitometry, microdensitometry, and macrodensitometry of pit images on micrographs are deduced. The dependences of the differential distributions and averaged values of pits optical densities on the ions passed ranges in the water phantom are calculated. Pairwise fittings by linear functions of the mutual dependences of the averaged values from each other and from the specific energy losses of ions are performed. It is shown that the most accurate linear fit is for the optical density-pit depth relationship.
机译:这项工作是我们在2018年发布的方法的进一步发展,用于计算机分析从塑料探测器CR-39取出的显微照片,在辐射〜(12)C离子的光束中辐射后蚀刻在放射生理学中的216mev / Amu的射击后ITEP-TWAC加速器储存复合物的研究室。这项工作的目的是研究蚀刻塑料中的凹坑的几何和光学参数。本研究基于降低半径的新概念,这是倾斜锥形微孔和纳米凹坑的横截面的横截面的半径,其纵向轴和检测器的蚀刻表面的倾斜点;推导出计算的配方。在填充空气的放射生物学室中照射一个Cr-39板,并且在填充有水(幻像)的腔室的不同深度处暴露8个板。发现并在板中发现并分析了275,070个蚀刻孔的图像。获得降低的半径和凹坑深度的差分频率分布及其在板的蚀刻表面上的平均值。推导出纳米损成对心,微渗目测定法和显微图像上的微调测定法的公式。计算差分分布的差分分布和平均值的凹坑光密度在水模型中的范围内的范围。通过彼此平均值和来自离子的特定能量损失的平均值的相互依赖性的线性函数的成对配件。结果表明,最精确的线性配合是用于光学密度凹坑深度关系。

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