首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Charge-state distributions and charge-changing cross sections and their impact on the performance of AMS facilities
【24h】

Charge-state distributions and charge-changing cross sections and their impact on the performance of AMS facilities

机译:电荷状态分布和电荷变化截面及其对AMS设施性能的影响

获取原文
获取原文并翻译 | 示例
           

摘要

The charge state distributions of ions passing through gases or foils have a significant influence on the performance of AMS facilities. Most important is the stripping process in the terminal of the accelerator. Published data on charge state distributions have been collected as well as associated charge-changing cross sections for various projectiles and targets relevant to AMS. Based on these data, the stripping yields as function of the stripper thickness and ion energy are calculated. This allows to evaluate the stripping thickness required for reaching charge state equilibrium, as well as mass fractionation effects depending on energy and stripper thickness. The significantly different behavior of helium compared to other gases leads to very high stripping yields for specific charge states at low energies. The cross sections for electron detachment of negative ions give a tool for estimating beam losses in the low energy acceleration tube. Further, electron capture and loss cross sections allow the estimation of backgrounds caused by charge exchange processes in the acceleration tubes. The effects discussed here are illustrated with calculations and simulations for Carbon beams. The data are useful for the design of new AMS facilities or improving existing ones.
机译:穿过气体或金属箔的离子的电荷状态分布对AMS设备的性能有重要影响。最重要的是加速器终端中的剥离过程。已经收集了关于装药状态分布的公开数据以及与AMS相关的各种弹丸和目标的相关装药变化截面。基于这些数据,计算了作为剥离剂厚度和离子能量的函数的剥离产率。这允许评估达到电荷状态平衡所需的剥离厚度,以及取决于能量和剥离剂厚度的质量分馏效应。与其他气体相比,氦气的行为显着不同,导致低能量下特定电荷状态的汽提产率很高。负离子电子脱离的横截面为估算低能加速管中的电子束损耗提供了一种工具。此外,电子俘获和损耗截面允许估算由加速管中的电荷交换过程引起的背景。此处讨论的效果通过碳束的计算和模拟进行了说明。该数据对于设计新的AMS设施或改进现有设施很有用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号