The read-out and control system For the ATLAS Semiconductor Tracker

摘要

The Semiconductor Tracker (SCT) in the ATLAS experiment has entered the stage of system assembly. Around 35% of the 4088 silicon modules are already produced, tested and will soon be mounted on the four barrel cylinders and 18 end-cap disks which make up the SCT. A new Data Acquisition System (DAQ) will provide binary readout, via front-end ASICs, of 16,000 silicon wafers and 6.3 million read-out channels using optical links. A new Detector Control System (DCS) will control up to 500 V bias voltage and the 30 kW low voltage power to the modules, as well as monitor the C_3F_8 evaporative cooling system, humidity and temperatures. Recently, several macro-assembly sites have mounted modules on both end-cap and barrel prototype structures and gained first experience with system-operation of the SCT. This presentation will give an overview of the full system required to operate and read-out a large-scale silicon detector. A description of both off-detector systems, DAQ and DCS, and their interactions will be presented, as well as the macro-assembly status.