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Double-layer silicon PIN photodiode X-ray detector for a future X-ray timing mission

机译:双层硅PIN光电二极管X射线探测器,可用于未来的X射线计时任务

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摘要

A double-layer silicon detector consisting of two 500-mu m-thick silicon PIN photodiodes with independent readouts was mounted in a vacuum chamber and tested with X-ray sources. The detector is sensitive from 1 to 30 keV with an effective area of 6 mm(2). The detector performs best at -35 degrees C with an energy resolution of 220eV (FWHM, full-width at half-maximum) at 5.9 keV, and is able to operate at room temperature, +25 degrees C, with moderate resolution around 760 eV (FWHM). The response of the top layer sensor is highly uniform across the sensitive area. This large-format silicon detector is appropriate for future X-ray timing missions. (c) 2006 Elsevier B.V. All rights reserved.
机译:将由两个具有独立读数的500微米厚硅PIN光电二极管组成的双层硅检测器安装在真空室中,并用X射线源进行测试。该探测器的灵敏度为1到30 keV,有效面积为6 mm(2)。该探测器在-35摄氏度下的最佳性能为5.9 keV,能量分辨率为220eV(FWHM,半峰全宽),并且能够在+25摄氏度的室温下以760 eV的中等分辨率工作(FWHM)。顶层传感器的响应在整个敏感区域高度一致。这种大型的硅探测器适合将来的X射线定时任务。 (c)2006 Elsevier B.V.保留所有权利。

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