Extraction of correlated count rates using various gate generation techniques: Part II Experiment

摘要

This paper presents an experimental comparison of different neutron pulse train analysis methods developed to extract correlated count rates from the detected neutron arrival times. This work comprises a sequel to the previous paper (Part I Theory) [1], where the complete formalism of different analysis methods was presented. In the current paper, the signal triggered inspection (S77), randomly triggered inspection (R77) and MIXED techniques (implemented in current shift register hardware) are compared using list mode data acquired from series of ~(252)Cf sources. In addition, three techniques of randomly triggered inspection are investigated: gates generated at fixed clock frequency, i.e., consecutive (non-overlapping) gates and overlapping gates (known as fast accidentals sampling (FAS)), as well as gates generated after a long delay following each trigger pulse (delayed-signal gates). The average correlated count rates (singles (S), doubles (D) and triples (T)) are extracted using the STI, RTI and MIXED analysis techniques and compared to demonstrate their equivalence. In addition, an influence of different gate generation and pulse train analysis techniques on the precision of the measured S, D and T rates is investigated.