...
首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Optimization of microwave-induced chemical etching for rapid development of neutron-induced recoil tracks in CR-39 detectors
【24h】

Optimization of microwave-induced chemical etching for rapid development of neutron-induced recoil tracks in CR-39 detectors

机译:优化微波诱导化学蚀刻,以快速发展CR-39探测器中的中子引起的后坐力轨迹

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

A systematic investigation is carried out to optimize the recently established microwave-induced chemical etching (MICE) parameters for rapid development of neutron-induced recoil tracks in CR-39 detectors. Several combinations of all available microwave powers with different etching durations were analysed to determine the most suitable etching condition. The etching duration was found to reduce with increasing microwave power and the tracks were observed at about 18,15,12, and 6 min for 300, 450, 600 and 900 W of microwave powers respectively compared to a few hours in chemical etching (CE) method. However, for complete development of tracks the etching duration of 30, 40, 50 and 60 min were found to be suitable for the microwave powers of 900, 600, 450 and 300 W, respectively. Temperature profiles of the etchant for all the available microwave powers at different etching durations were generated to regulate the etching process in a controlled manner. The bulk etch rates at different microwave powers were determined by 2 methods, viz., gravimetric and removed thickness methods. A logarithmic expression was used to fit the variation of bulk etch rate with microwave power. Neutron detection efficiencies were obtained for all the cases and the results on track parameters obtained with MICE technique were compared with those obtained from another detector processed with chemical etching.
机译:进行了系统的研究,以优化最近建立的微波诱导化学蚀刻(MICE)参数,以快速开发CR-39检测器中的中子引起的后坐力轨迹。分析了具有不同蚀刻持续时间的所有可用微波功率的几种组合,以确定最合适的蚀刻条件。发现蚀刻时间会随着微波功率的增加而减少,并且与化学蚀刻的几个小时相比,分别在300、450、600和900 W的微波功率下,分别在大约18、15、12和6分钟观察到轨迹, ) 方法。然而,为了完全发展轨道,发现30、40、50和60分钟的蚀刻时间分别适合900、600、450和300 W的微波功率。生成了在不同蚀刻持续时间下所有可用微波功率的蚀刻剂温度曲线,以受控方式调节蚀刻过程。通过两种方法,即重量法和去除厚度法,确定在不同微波功率下的整体蚀刻速率。使用对数表达式来拟合微波功率对整体蚀刻速率的影响。在所有情况下均获得了中子探测效率,并将通过MICE技术获得的航迹参数结果与从另一台经过化学蚀刻处理的探测器获得的结果进行了比较。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号