机译:用于X射线检测的4H-SiC肖特基二极管阵列
Semiconductor Materials and Devices Laboratory, School of Engineering and Informatics, University of Sussex, Falmer, Brighton BN1 9QT, UK;
School of Electrical and Electronic Engineering, Newcastle University, Newcastle upon Tyne NE1 7RU, UK;
Semiconductor Materials and Devices Laboratory, School of Engineering and Informatics, University of Sussex, Falmer, Brighton BN1 9QT, UK;
School of Electrical and Electronic Engineering, Newcastle University, Newcastle upon Tyne NE1 7RU, UK;
School of Electrical and Electronic Engineering, Newcastle University, Newcastle upon Tyne NE1 7RU, UK;
School of Electrical and Electronic Engineering, Newcastle University, Newcastle upon Tyne NE1 7RU, UK;
Semiconductor Materials and Devices Laboratory, School of Engineering and Informatics, University of Sussex, Falmer, Brighton BN1 9QT, UK;
Silicon carbide; Schottky diodes; X-ray spectroscopy; High temperature;
机译:具有Ni_2Si触点的4H-SiC肖特基二极管用于X射线检测
机译:具有Ni_2SI触点的4H-SiC肖特基二极管用于X射线检测
机译:4H-SiC肖特基势垒二极管,结屏障肖特基二极管和引脚二极管的温度传感性能比较
机译:质子辐照缺陷对4H-SiC肖特基二极管X射线探测器的影响
机译:用于X射线成像的硅二极管MOSAIC ARRAY VIDICON管。
机译:具有4H-SIC肖特基二极管的60-700 k CTAT和PTAT温度传感器
机译:用于X射线检测的4H-SiC肖特基二极管阵列