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A counting-weighted calibration method for a field-programmable-gate-array-based time-to-digital converter

机译:基于现场可编程门阵列的时间数字转换器的计数加权校准方法

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In this work, we propose a counting-weighted calibration method for field-programmable-gate-array (FPGA)-based time-to-digital converter (TDC) to provide non-linearity calibration for use in positron emission tomography (PET) scanners. To deal with the non-linearity in FPGA, we developed a counting-weighted delay line (CWD) to count the delay time of the delay cells in the TDC in order to reduce the differential non-linearity (DNL) values based on code density counts. The performance of the proposed CWD-TDC with regard to linearity far exceeds that of TDC with a traditional tapped delay line (TDL) architecture, without the need for nonlinearity calibration. When implemented in a Xilinx Vertix-5 FPGA device, the proposed CWD-TDC achieved time resolution of 60 ps with integral non-linearity (INL) and DNL of [-0.54, 0.24] and [-0.66, 0.65] least-significant-bit (LSB), respectively. This is a clear indication of the suitability of the proposed FPGA-based CWD-TDC for use in PET scanners.
机译:在这项工作中,我们提出了一种基于现场可编程门阵列(FPGA)的时间数字转换器(TDC)的计数加权校准方法,以提供用于正电子发射断层扫描(PET)扫描仪的非线性校准。为了解决FPGA中的非线性问题,我们开发了计数加权延迟线(CWD)来计算TDC中延迟单元的延迟时间,以减少基于代码密度的差分非线性(DNL)值计数。提出的CWD-TDC在线性方面的性能远远超过采用传统抽头延迟线(TDL)架构的TDC,而无需进行非线性校准。当在Xilinx Vertix-5 FPGA器件中实施时,拟议的CWD-TDC实现了60 ps的时间分辨率,积分非线性(INL)和DNL为[-0.54,0.24]和[-0.66,0.65]最低有效-位(LSB)。这清楚表明所提出的基于FPGA的CWD-TDC适用于PET扫描仪。

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