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机译:用背面激光照射掺杂形成/ CDTE / AU肖特基和P-N结 - 二极管检测器的比较研究
Graduate School of Science and Technology Shizuoka University 3-5-1 Johoku Naka-ku Hamamatsu 432-8011 Japan;
V.E. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine Prospekt Nauky 41 Kyiv 03028 Ukraine Research Institute of Electronics Shizuoka University 3-5-1 Johoku Naka-ku Hamamatsu 432-8011 Japan;
Research Institute of Electronics Shizuoka University 3-5-1 Johoku Naka-ku Hamamatsu 432-8011 Japan;
Research Institute of Electronics Shizuoka University 3-5-1 Johoku Naka-ku Hamamatsu 432-8011 Japan;
Graduate School of Science and Technology Shizuoka University 3-5-1 Johoku Naka-ku Hamamatsu 432-8011 Japan Research Institute of Electronics Shizuoka University 3-5-1 Johoku Naka-ku Hamamatsu 432-8011 Japan;
CdTe crystal; Schottky diode; Backside laser irradiation doping; p-n junction diode; X/γ-ray detector; I-V characteristics; Isotope emission spectra; Thermal tolerance;
机译:加热对/ CdTe / Au X和γ射线检测器的电和光谱性能与肖特基势垒或激光诱导的P-N结的影响
机译:光谱无关激光辐照光伏效应HgCdTe探测器的研究
机译:光谱无关激光辐照光伏-HgCdTe探测器的光电效应研究
机译:通过激光诱导掺杂形成具有p-n结的CdTe二极管探测器
机译:“蒙特利尔杂志”和电子杂志ruefrontenac.com中信息质量的比较研究。
机译:掺钕钇铝石榴石(Nd:YAG)激光辐照下长石瓷表面的扫描电镜比较
机译:激光诱导掺杂技术形成CDTE型结构的同步辐射X射线光电子光谱研究
机译:半导体等效电路模型在正向偏置下au掺杂p-N结的研究中的应用。