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Under-Barrier Leakage of the Quantum-Mechanical Current Density Owing to the Interference of Electron Waves in the 2D Semiconductor Nanostructures

机译:由于二维半导体纳米结构中电子波的干扰,量子力学电流密度的下势垒泄漏。

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摘要

The theoretical analysis of the under-barrier leakage of the local quantum-mechanical current density in the 2D semiconductor nanostructures that represent narrow and wide rectangular quantum wells sequentially located along the propagation direction of electron wave is presented. The wave arrives from the narrow quantum well at a semi-infinite rectangular potential barrier with height V{) in the wide quantum well. Under certain conditions, the exponentially decaying and coordinate-dependent leakage of the local quantum-mechanical current density under barrier is allowed for the waves with energies of less than V() due to the interference of electron waves in such a nanostructure.
机译:提出了二维半导体纳米结构中局部量子力学电流密度在势垒下泄漏的理论分析,该二维半导体纳米结构代表了沿电子波的传播方向顺序排列的窄而宽的矩形量子阱。波从窄量子阱到达宽量子阱中高度为V {)的半无限矩形势垒。在某些条件下,由于电子波在这种纳米结构中的干扰,对于能量小于V()的波,势垒下局部量子力学电流密度的指数衰减和依赖坐标的泄漏是允许的。

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