Applications of Synchrotron Surface X-ray Scattering Studies Of electrochemical Interfaces

摘要

In this article we have reviewed ele- mentary aspects of the synchrotron-based x-ray-scattering technique for the inves- tigation of the structure of electrochemical interfaces and some of its preliminary applications for the investigation of "buried" liquid/solid interfaces. We have shown its capability for providing de- tailed structural information on liquid/ solid interfaces. We expect that, as the operation of the high-energy synchro- tron sources advances, liquid/solid inter- face studies will also advance closer to the maturity level of current UHV sur- face science and beyond.