SYNCHROTRON X-RAY SCATTERING STUDIES OF SINGLE-CRYSTAL ELECTRODE SURFACES

摘要

By combining in-situ surface x-ray diffraction measurements with more traditional electrochemical techniques,it is possible to probe the influence of surface structure on the electrochemical reactivity.This functionality is generally termed "structure sensitivity".In the last decade,the in-situ surface x-ray diffraction technique has been a critical tool for determining the potential stability of specific surface structures in electrolyte under reaction conditions.On the other hand,the rotating ring disk electrode (RRDE) has been routinely used for determining the kinetics of electrochemical reactions on single crystal surfaces and evaluating the potential-dependent surface coverage by an adsorbed species.