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Simulation study for the use of transistor contacts for sub-terahertz radiation detection

机译:晶体管触点用于太赫兹辐射探测的仿真研究

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Despite the increasing evidence that on-chip metallisation layer plays the role of an antenna in field effect transistor terahertz detectors, sufficient study and analysis of this role remain lacking. Three-dimensional (3D) simulation is used to study the efficiency of sub-terahertz electromagnetic radiation coupling to on-chip metallisation layer components. The results suggest that on-chip metallisation, especially the contacts of the field effect transistor, can be used as an effective antenna with reasonable efficiency. The two basic structures tested are the laterally stacked as well as vertically stacked contacts. The effect of varying a number of design parameters of the suggested test structures (e.g. substrate/inter-metal-dielectric thickness, and contacts dimensions) is studied using 3D simulation, and the overall detection efficiency is extracted in each case. These results are used to extract broad guidelines for the efficient use of the on-chip metallisation layer as an effective detecting antenna in sub-terahertz radiation detectors
机译:尽管越来越多的证据表明片上金属化层在场效应晶体管太赫兹检测器中起着天线的作用,但仍缺乏对此作用的充分研究和分析。三维(3D)仿真用于研究亚太赫兹电磁辐射耦合到芯片上金属化层组件的效率。结果表明,片上金属化,尤其是场效应晶体管的触点,可以用作具有合理效率的有效天线。测试的两个基本结构是横向堆叠和垂直堆叠的触点。使用3D模拟研究了改变建议的测试结构的多个设计参数(例如衬底/金属间电介质厚度和接触尺寸)的影响,并在每种情况下提取了总的检测效率。这些结果可用于提取广泛的指导方针,以有效地使用片上金属化层作为亚太赫兹辐射探测器中的有效探测天线

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