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首页> 外文期刊>Microwave Journal >MEASURING THE CAPACITANCE COEFFICIENTS OF COAXIAL OPEN-CIRCUITS WITH TRACEABILITY TO NATIONAL STANDARDS
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MEASURING THE CAPACITANCE COEFFICIENTS OF COAXIAL OPEN-CIRCUITS WITH TRACEABILITY TO NATIONAL STANDARDS

机译:可以测量符合国家标准的同轴开路的电容系数

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摘要

Coaxial open-circuits are often used as measurement reference standards and can be found in most commercially available vector network analyzer (VNA) calibration kits. The capacitance characteristics of these devices are usually summarized in terms of the coefficients of a polynomial used to describe their frequency dependence. This article describes a method of measuring these capacitance coefficients and presents a detailed analysis of the uncertainty of the measurement, which includes using the Monte Carlo method in conjunction with a least-squares fitting process. The resulting measurement method enables these standards to be 'calibrated' with known uncertainty and with traceability to national measurement standards.
机译:同轴开路通常用作测量参考标准,并且可以在大多数商用矢量网络分析仪(VNA)校准套件中找到。这些设备的电容特性通常根据用于描述其频率依赖性的多项式系数来概括。本文介绍了一种测量这些电容系数的方法,并给出了测量不确定性的详细分析,其中包括结合使用蒙特卡罗方法和最小二乘拟合过程。最终的测量方法使这些标准能够以已知的不确定性进行“校准”,并且可溯源至国家测量标准。

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