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Fully Automated Calibration System

机译:全自动校准系统

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摘要

ATE Systems has developed the next generation of microwave instrument calibration technology. This third generation approach is fully automated, virtually eliminating the possibility of user-induced error, while providing accuracy that meets TRL-level verification and significantly reducing the time required for calibration. The first generation approach, still in common use today, involves connecting mechanical calibration artifacts to the instrument and measuring them to determine systematic error terms. This technique typically involves connecting a series of reflection standards to each test port one at a time, and making through connections between pairs of test ports. Alternate calibration techniques involve some variations on this general approach, but all involve connecting and disconnecting a series of calibration standards at each test port.
机译:ATE Systems开发了下一代微波仪器校准技术。这种第三代方法是完全自动化的,几乎消除了用户引发错误的可能性,同时提供了可以满足TRL级验证的准确性,并大大减少了校准所需的时间。如今仍在普遍使用的第一代方法涉及将机械校准伪像连接到仪器并对其进行测量以确定系统误差项。该技术通常涉及一次将一系列反射标准连接到每个测试端口,并通过成对的测试端口之间的连接进行连接。替代校准技术涉及此通用方法的某些变体,但所有方法都涉及在每个测试端口上连接和断开一系列校准标准。

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  • 来源
    《Microwave Journal 》 |2013年第8期| 102104106| 共3页
  • 作者

    ATE Systems;

  • 作者单位

    Billerica, MA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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