Efficient Parametric Characterization of the Dynamic Performance of an RFID IC

摘要

In this letter, a measurement technique for a complete parametric characterization of the input impedance of an RFID IC is presented. The use of an SPDT switch to modulate the signal from the network analyzer provides the capability to measure the RFID IC activation level and its input impedance simultaneously. This data can then be used to fully predict the dynamic response and performance of an RFID tag.