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TSMC's Burn Lin

机译:台积电的伯恩·林

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Burn Lin has been extending the limits of optical lithography for more than 30 years. The list of articles he has written—many of them the first of their kind on certain topics-reads like a what's what of advanced litho technology: deep-UV, multilayer photoresist systems, depth-of-field (DOF) and resolution scaling equations, k1 reduction, optimum numerical aperture (NA) in projection printing, and many more. But in his role as senior director in TSMC's micropatterning technology division over the past couple of years, Lin has been focused on 193-nm immersion, becoming one of its most fervent champions. What was once a lithographic curiosity has become the optical extension method of choice, due in no small part to Lin's scientific and diplomatic skills. Before joining TSMC, Lin held various technical and managerial positions in the microlithography field at IBM. An SPIE and IEEE fellow, Lin has received numerous honors over the course of his career, including SPIE's first Fritz Zernike Award for Microlithography in 2004, TSMC's outstanding innovation award (also in 2004), and Taiwan's outstanding engineer award in 2002. He is editor in chief of the Journal of Microlithography, Microfabrication and Microsystems. He has also been president of his own company, Linnovation, since 1992.
机译:Lin Lin一直在扩展光学光刻技术的极限,已有30多年的历史。他撰写的文章清单-其中许多是某些主题的同类文章中的第一篇-读懂先进的光刻技术是什么:深紫外线,多层光刻胶系统,景深(DOF)和分辨率缩放方程式,减少k1,投影打印中的最佳数值孔径(NA)等。但在过去几年中,他担任台积电微图案技术部门的高级总监,一直专注于193 nm浸入,成为其最热烈的拥护者之一。由于林的科学和外交技巧,曾经是光刻的好奇心已成为首选的光学扩展方法。在加入台积电之前,Lin在IBM的微光刻领域担任过各种技术和管理职务。 Lin是SPIE和IEEE研究员,在其职业生涯中获得了无数荣誉,包括2004年SPIE的第一届Fritz Zernike微光刻奖,TSMC的杰出创新奖(也是2004年)和2002年的台湾杰出工程师奖。他是编辑。 《微光刻,微细加工和微系统杂志》的负责人。自1992年以来,他还一直担任自己的公司Linnovation的总裁。

著录项

  • 来源
    《Micro》 |2005年第5期|p.22-23|共2页
  • 作者

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 环境科学、安全科学;
  • 关键词

  • 入库时间 2022-08-18 00:10:38

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