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首页> 外文期刊>Micro & Nano Letters, IET >Fracture mechanism of movable part in micro-electro-mechanical systems device based on empirical electron theory
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Fracture mechanism of movable part in micro-electro-mechanical systems device based on empirical electron theory

机译:基于经验电子理论的微机电系统装置中活动部件的断裂机理

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摘要

The fracture of movable part is a serious issue in micro-electro-mechanical systems (MEMS) device application. However, its fracture mechanism is not clear yet. The fracture mechanism of movable part based on empirical electron theory (EET) of solids and molecules, in which fracture model is built based on valence electron structure and broken bond of the crystal plane is clarified. Simulation and test results match EET-fracture model quite well with low errors of 8.22 and 5.95%, respectively, which shows a good accuracy among existing fracture models. It is believed that EET-fracture model is quite effective and useful to evaluate movable part function in the research of MEMS devices.
机译:在微机电系统(MEMS)设备应用中,可移动部件的断裂是一个严重的问题。但是,其断裂机理尚不清楚。基于固体和分子的经验电子理论(EET),可移动部件的断裂机理,其中基于价电子结构建立了断裂模型,并阐明了晶面的断裂键。仿真和测试结果与EET裂缝模型非常吻合,误差分别为8.22和5.95%,这在现有裂缝模型中显示出良好的准确性。可以相信,EET断裂模型对于评估MEMS器件的活动部件功能是非常有效和有用的。

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