...
首页> 外文期刊>Micro & Nano Letters, IET >Effects of isopropyl alcohol and acetic acid on surface roughness of Z-cut quartz etched by ammonium bifluoride solution
【24h】

Effects of isopropyl alcohol and acetic acid on surface roughness of Z-cut quartz etched by ammonium bifluoride solution

机译:异丙醇和乙酸对氟化氢铵蚀刻的Z形切割石英表面粗糙度的影响

获取原文
获取原文并翻译 | 示例
           

摘要

Quartz has been widely used in modern microelectromechanical systems (MEMS) industry, and wet etching is one of the primary techniques used for its manufacturation. There are many reported literatures focused on the study of etched profiles or etching rate of quartz, but few on its surface quality. Inspired by the surface quality improved by using additives in the silicon wet etching process, the effects of isopropyl alcohol (IPA) and acetic acid on the surface roughness of Z-cut quartz etched by ammonium bifluoride (NHHF) solution were investigated for the first time. Different concentration of IPA or/and acetic acid was added into the NHHF solution, and the morphology of the etched surface was observed using scanning electron microscope and measured by a surface profilometer. It was found that the surface roughness of the Z-cut quartz decreased with the increasing of IPA or acetic acid concentration. Moreover, the etched surface roughness could be further decreased by using the ternary solution containing IPA and acetic acid. The best etched result ( = 0.12 μm) was obtained when the solution is composed of saturated NHHF + 15% v/v IPA + 10% v/v acetic acid. This work provides a new method to improve the surface quality of Z-cut quartz, and it will benefit the future design and manufacturation work of quartz MEMS devices.
机译:石英已广泛用于现代微机电系统(MEMS)工业中,并且湿法蚀刻是制造石英玻璃的主要技术之一。有许多报道的文献专注于石英的蚀刻轮廓或蚀刻速率的研究,但很少涉及其表面质量。受到硅湿法刻蚀中添加添加剂改善表面质量的启发,首次研究了异丙醇(IPA)和乙酸对双氟化铵(NHHF)溶液刻蚀Z形切割石英表面粗糙度的影响。 。将不同浓度的IPA或/和乙酸添加到NHHF溶液中,使用扫描电子显微镜观察并通过表面轮廓仪测量蚀刻后的表面形态。发现随着IPA或乙酸浓度的增加,Z切石英的表面粗糙度降低。此外,通过使用包含IPA和乙酸的三元溶液,可以进一步降低蚀刻的表面粗糙度。当溶液由饱和NHHF + 15%v / v IPA + 10%v / v乙酸组成时,可获得最佳蚀刻结果(= 0.12μm)。这项工作为提高Z切石英的表面质量提供了一种新方法,它将有益于石英MEMS器件的未来设计和制造工作。

著录项

  • 来源
    《Micro & Nano Letters, IET》 |2017年第10期|781-783|共3页
  • 作者单位

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

    Institute of Electronic Engineering, China Academy of Engineering Physics, People's Republic of China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ammonium compounds; etching; quartz; scanning electron microscopy; surface morphology; surface roughness;

    机译:铵化合物;蚀刻;石英;扫描电镜;表面形态;表面粗糙度;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号