Development of a thermal diffusivity measurement system with a picosecond thermoreflectance technique

摘要

The picosecond thermoreflectance technique is a unique method for measuring the thermal diffusivity of thin films of submicrometre thickness deposited on substrate. The picosecond thermoreflectance system developed by the National Research Laboratory of Metrology uses a mode-locked titanium sapphire laser as the picosecond light source. The pulse of 2 ps duration is divided into the pump beam for heating (90/100) and the probe beam for temperature detection (10/100).