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Wetting and interfacial reaction characteristics of Sn-1.2Ag-0.5Cu-xIn quaternary solder alloys

机译:Sn-1.2Ag-0.5Cu-xIn四元钎料合金的润湿和界面反应特性

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摘要

Through the use of a wetting balance technique, the wetting characteristics of Sn-1.2Ag-0.5Cu-xIn quaternary solder alloys with respect to the In content and soldering temperature were investigated to validate the applicability of compositions with a low Ag content as solder material. It was found that a small addition (0.4–0.6 wt.%) of In significantly improved the wetting properties of the Sn-1.2Ag-0.5Cu-xIn composition at soldering temperatures ranging from 230 °C to 240 °C due to the excellent wetting property of In. In an observation of the interfacial reaction, it was found that the added In element did not participate in the interfacial reaction with a Cu or Ni pad, unlike in the Sn-Ag-Cu-In case, which has a high In content. The package or boardside IMC layers in Sn-1.2Ag-0.5Cu-0.4In joints were thinner than those of Sn-3.0Ag-0.5Cu, especially after aging.
机译:通过使用润湿平衡技术,研究了Sn-1.2Ag-0.5Cu-xIn四元焊料合金相对于In含量和焊接温度的润湿特性,以验证具有低Ag含量的组合物作为焊料的适用性。已发现,少量添加(0.4–0.6 wt。%)的In可以显着改善Sn-1.2Ag-0.5Cu-xIn组合物在230°C至240°C的焊接温度下的润湿性能。 In的润湿特性。在观察界面反应时,发现添加的In元素不参与与Cu或Ni垫的界面反应,这与具有高In含量的Sn-Ag-Cu-In情况不同。 Sn-1.2Ag-0.5Cu-0.4In接头中的封装或板侧IMC层比Sn-3.0Ag-0.5Cu的薄,尤其是在老化后。

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