In-Situ X-Ray Diffraction Observations of Low-Temperature Ag-Nanoink Sintering and High-Temperature Eutectic Reaction with Copper

摘要

Nanoinks, which contain nanometer-sized metallic particles suspended in an organic dispersant fluid, are finding numerous microelectronic applications. One characteristic of nanoinks is that they sinter at much lower temperatures than bulk metals due to their high surface area to volume ratio and small radius of curvature, which reduces their melting points significantly below their bulk values. The unusually low sintering temperatures have unique potential for materials joining, since their melting points increase dramatically afterward. In this article, the sintering kinetics of Ag nanoink is studied using in-situ synchrotron methods to determine diffraction peak characteristics during the sintering cycle, and to subsequently calculate particle size and growth during sintering. Ag nanoink is further explored as a eutectic bonding medium by tracking phase transformations between sintered Ag nanoink and a Cu substrate to high temperatures, where melting occurs at the Ag-Cu eutectic, demonstrating nanoinks as a viable eutectic bonding medium.