STANDARD REFERENCE MATERIALS OF HIGH-PURITY SUBSTANCES FOR METROLOGICAL SUPPORT OF ANALYTICAL MONITORING OF NANOMATERIALS AND THEIR HIGH-PURITY PRECURSORS

摘要

We consider aspects involved in preparation of chemical composition standard reference materials (SRMs) for nanomaterials. We show that the primary requirement for metrological support of analytical measurements is the availability of SRMs with certified chemical purity. We describe a procedure for preparation and certification of 40 such SRMs based on the Exhibition Collection of High-Purity Substances of the Russian Academy of Sciences. We describe modern methods for analysis of high-purity substances and nanomaterials based on them. We discuss problems involved in application of SRMs in nanoanalysis.