首页> 外文期刊>Measurement techniques >EVALUATION OF METROLOGICAL PROPERTIES IN DEVELOPING AND CERTIFYING PROCEDURES OF ARC ATOMIC-EMISSION ANALYSIS OF NONFERROUS AND RARE METALS WITH PHOTODIODE RECORDING
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EVALUATION OF METROLOGICAL PROPERTIES IN DEVELOPING AND CERTIFYING PROCEDURES OF ARC ATOMIC-EMISSION ANALYSIS OF NONFERROUS AND RARE METALS WITH PHOTODIODE RECORDING

机译:用光电二极管记录的有色金属和稀有金属的电弧原子发射分析的开发和认证过程中的计量学性能评估

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摘要

The possibilities of improving metrological properties of direct arc atomic-emission analysis of nonferrous and rare metals (Ga, Cd, In, and Zn) with application ofphotodiode recording are studied. Procedures for arc atomic-emission analysis of nonferrous and rare metals are improved, and their precision is increased considerably.
机译:研究了通过光电二极管记录来改善有色金属和稀有金属(Ga,Cd,In和Zn)的直接电弧原子发射分析的计量性能的可能性。改进了有色金属和稀有金属的电弧原子发射分析程序,并大大提高了它们的精度。

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