A METHOD AND DEVICE FOR MEASURING THE CAPACITANCE AND Q-FACTOR OF MICROWAVE VARACTORS AND VARICONDS

摘要

A method and device for measuring the bias-voltage dependences of the Q-factor and capacitance for variconds and varactors of different dimensions and structures (two-electrode and three-electrode structures) in the 1-10 GHz frequency band are considered. By placing the devices to be measured outside a closed resonant cavity in a special microstrip holder, the measuring instrument can easily be adapted for rapid automated certification of the components and their mass production.