Anomalous X-ray Scattering Method for Determining Electron Density Distribution in Amorphous Selenium

摘要

A new method has been proposed for estimating the electron density distribution of disordered materials in their pure states by applying the anomalous dispersion effect near the absorption edge. The essential equations for analyzing the measured intensity data and the capability of this method were described by obtaining the electron density distribution function in amorphous Se as an example.