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Microstructural and optical characterization of CaWO_4 and SrWO_4 thin films prepared by a chemical solution method

机译:化学溶液法制备的CaWO_4和SrWO_4薄膜的微观结构和光学特性

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Stoichiometric CaWO_4 and SrWO_4 thin films were synthesized using a chemical solution processing, the so-called polymeric precursor method. In this soft chemical method, soluble precursors such as strontium carbonate, calcium carbonate and tungstic acid, as starting materials, were mixed in an aqueous solution. The thin films were deposited on glass substrates by means of the spinning technique. The surface morphology and crystal structure of the thin films were investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Nucleation stages and surface morphology evolution of the thin films on glass substrates were studied by atomic force microscopy. The films nucleate at 300 deg C, after the coalescence of small nuclei into larger grains yielding a homogeneous dense surface. XRD characterization of these films showed that the CaWO_4 and SrWO_4 phases crystallize at 400 deg C from an inorganic amorphous phase. No intermediate crystalline phase was identified. The optical properties were also studied. It was found that CaWO_4 and SrWO_4 thin films have an optical band gap, E_(gap)=5.27 and 5.78 eV, respectively, of a direct transition nature. The excellent microstructural quality and chemical homogeneity confirmed that this soft solution processing provides an inexpensive and environmentally friendly route for the preparation of CaWO_4 and SrWO_4 thin films.
机译:化学计量的CaWO_4和SrWO_4薄膜是使用化学溶液处理(所谓的聚合物前体方法)合成的。在这种软化学方法中,将诸如碳酸锶,碳酸钙和钨酸之类的可溶性前体作为起始原料在水溶液中混合。借助于旋转技术将薄膜沉积在玻璃基板上。使用X射线衍射(XRD),扫描电子显微镜(SEM)和原子力显微镜(AFM)研究了薄膜的表面形态和晶体结构。通过原子力显微镜研究了玻璃基板上薄膜的成核阶段和表面形貌演变。小核聚结成较大的晶粒后,薄膜在300℃成核,从而产生均匀致密的表面。这些薄膜的XRD表征表明,CaWO_4和SrWO_4相在400摄氏度时从无机非晶态结晶。没有鉴定出中间结晶相。还研究了光学性质。已发现CaWO_4和SrWO_4薄膜具有直接跃迁性质的光学带隙E_(gap)= 5.27和5.78eV。优异的微观结构质量和化学均匀性证实,这种软溶液处理为制备CaWO_4和SrWO_4薄膜提供了一种廉价且环保的途径。

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