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机译:用于结构材料各种TEM分析的TEM样品改良制备技术
Nuclear Materials Division, Korea Atomic Energy Research Institute, 1045 Daeduck-daero, Yuseong-gu, Daejeon 305-353, Republic of Korea;
Nuclear Materials Division, Korea Atomic Energy Research Institute, 1045 Daeduck-daero, Yuseong-gu, Daejeon 305-353, Republic of Korea;
Nuclear Materials Division, Korea Atomic Energy Research Institute, 1045 Daeduck-daero, Yuseong-gu, Daejeon 305-353, Republic of Korea;
Nuclear Materials Division, Korea Atomic Energy Research Institute, 1045 Daeduck-daero, Yuseong-gu, Daejeon 305-353, Republic of Korea;
Nuclear Materials Division, Korea Atomic Energy Research Institute, 1045 Daeduck-daero, Yuseong-gu, Daejeon 305-353, Republic of Korea;
focused ion beam; electron microscopy; radiation damage; sample preparation technique; in-situ strain TEM experiment;
机译:透射电子显微镜(TEM)核材料制备技术的比较
机译:从SEM截面到TEM样品-通过“补充”技术制备FIB样品的新功能
机译:Ti基含Ga非晶态合金的样品制备和HR-TEM研究技术
机译:FIB微采样技术和特定于特定的特定材料特性特征特征的特定方法
机译:用于TEM分析的碳纳米管复合样品制备的切片机切割工艺的改进。
机译:疏链材料有助于油溶性纳米材料的TEM样品制备
机译:EBSD-FIB样品制备技术通过TEM / STEM对变形邻苯二甲腈进行亚晶界分析